IS-350 Standard Scanner

The IS-350 is the versatile workhorse in the InsightScan family of acoustic microscopes. Its large sample holder and scan area, high spatial resolution, fast acquisition speed and large bandwidth make it a powerful lab instrument for high resolution R&D applications and at the same time a perfectly suitable instrument for high volume quality control in production environment.
 
Powerful scan technology
High speed technology: 900 mm/sec scan speed, 500 MHz receiver bandwidth, up to 4 GHz data sampling rate
Dual channel data acquisition for minimizing the acquisition time on one sample, or for simultaneous data acquisition on 2 different samples
Simultaneous pulse-echo and through transmission acquisition supported
Optional turntable sample holder available

Advanced software features
Real time full waveform acquisition: Collected data allow offline rescanning of the sample with different gate settings
Advanced analysis features: Generation of virtual B-scans and tomographic C-scans from stored data files
Slice scan for acquisition of a virtually unlimited number of C-scans on different depth levels simultaneously
Multi-lingual software in English, Japanese, Chinese, French, German, …
 
Wide application range
Semiconductor and microelectronics
CSP and Flip Chip underfil void evaluation and delamination analysis
Power semiconductor integrity evaluation
Internal defect inspection: Inclusions, cracks, die tilt
Interface evaluation of bonded wafers

Material analysis
Inclusion, crack and void detection in metals, plastics, resin

Interface analysis
Void evaluation in welds and brazed interfaces
Electrostatic chuck void detection
Delamination of composite materials
Interface analysis on heterogeneous assembled materials